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A. P. Mathur

D. Boardman, G. Greene, V. Khandelwal, and A. P. Mathur. LISTEN: A Tool to Investigate the Use of Sound for the Analysis of Program Behavior. In Proceedings of the 19th Annual International Computer Software and Applications Conference (COMPSAC '95), pages 184-193, Dallas, TX, August 1995. IEEE Press.

D. Boardman, V. Khandelwal, and A. P. Mathur. LSL: A Specification Language for Program Auralization. In Proceedings of the International Conference on Auditory Display, ICAD 94, pages 257-264, Santa Fe, NM, November 1994.

M.-H. Chen, P. Garg, A. P. Mathur, and V. Rego. Investigating Coverage-Reliability Relationship and Sensitivity of Reliability Estimates to Errors in the Operational Profile. In Proceedings of the 1994 International Computer Symposium, Hsinchu, Taiwan, ROC, December 1994.

M.-H. Chen, A. P. Mathur, and V. Rego. A Case Study in Investigating Sensitivity of Reliability Estimates to Errors in Operational Profile. In Proceedings of the Fifth International Symposium on Software Reliability Engineering, pages 276-281, Monterey, CA, November 1994. IEEE Press.

M.-H. Chen, A. P. Mathur, and V. Rego. Effect of Testing Techniques on Software Reliability Estimates Obtained Using a Time-Domain Model. IEEE Transactions on Reliability, 44(1):97-103, March 1995.

R. A. DeMillo, A. P. Mathur, and W. E. Wong. Some Critical Remarks on a Hierarchy of the Fault-Detecting Ability of Test Methods. *

F. Del Frate, P. Garg, A. P. Mathur, and A. Pasquini. On the Correlation Between Code Coverage and Software Reliability. In Proceedings of the Sixth International Symposium on Software Reliability Engineering, pages 124-132, Toulouse, France, October 1995. IEEE Press.

J. R. Horgan, S. London, A. P. Mathur, and W. E. Wong. Effect of Test Set Minimization on Fault Detection Effectiveness. In Proceedings of the 17th International Conference on Software Engineering, pages 41-50, Seattle, WA, April 1995.

J. C. Maldonado, W. E. Wong, and A. P. Mathur. Constrained Mutation in C Programs. In Proceedings of the VIII Simposio Brasileiro De Engenharia De Software, pages 439-452, Curitiba, October 1994.

J. C. Maldonado, W. E. Wong, and A. P. Mathur. Mutation Versus All-Uses: An Empirical Evaluation of Cost, Strength, and Effectiveness. In M. Lee, B.-Z. Barta, and P. Juliff, editors, Proceedings of the IFIP Conference on Software Quality and Productivity, pages 258-265, City Polytechnic of Hong Long, Hong Kong, December 1994. Chapman and Hall.

A. P. Mathur and E. Wong. Fault Detection Effectiveness of Mutation and Data Flow Testing. Software Quality Journal, 4:69-83, 1995.

A. P. Mathur and W. E. Wong. How Strong Is Constrained Mutation In Fault Detection? In Proceedings of the 1994 International Computer Symposium, pages 515-520, Taipei Section, Taiwan, December 1994. IEEE Press.

A. P. Mathur and W. E. Wong. Reducing the Cost of Mutation Testing: An Empirical Study. The Journal of Systems and Software, 31(3):185-196, December 1995.

E. W. Wong, J. R. Horgan, and A. P. Mathur. Effect of Test Set Size and Block Coverage on the Fault Detection Effectiveness. In Proceedings of the Fifth International Symposium on Software Reliability Engineering, pages 230-238, Monterey, CA, November 1994. IEEE Press.

CS Annual Report - 19 APR 1996

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